Picotest Load Steppers are featured on Efficient Power Conversion’s ‘GaN Talk’ with Renee Yawger

How Picotest Uses eGaN FETs to Design Groundbreaking High-Speed Transient Load Current Steppers – Revolutionizing Power System Testing for Data Center, AI, EV, ASIC, and Server Applications

We have launched a groundbreaking series of high-speed transient load current steppers using a previously unseen level of gallium nitride (GaN) integration.

This latest innovation is poised to redefine industry standards, particularly in demanding low-voltage, high-current applications, such as data centers, AI, graphics, EV, ASIC test, and servers.

These load steppers bring forth a range of capabilities that address critical challenges in power integrity testing.

Powering the Future

The Voltage Regulation Module (VRM) and power distribution network (PDN) validation, essential for start-up, dynamic transient performance, stability, and noise assessments, necessitate swift load current transitions, high peak and average power, and adaptable form factors.

Picotest’s revolutionary load steppers utilize GaN technology, innovative power delivery formats, and advanced cooling mechanisms to meet the stringent requirements of these power systems.

Read the rest of the article on GaN Talk, at EPC (Efficient Power Conversion) – How Picotest Uses eGaN FETs to Design Groundbreaking High-Speed Transient Load Current Steppers – Revolutionizing Power System Testing for Data Center, AI, EV, ASIC, and Server Applications (epc-co.com)