Calibration, Embedding & De-Embedding – Achieving Highly Accurate Impedance Results

Calibration, Embedding and De-Embedding – Achieving Highly Accurate Impedance Results

OMICRON Lab hosted their 14th Power Analysis & Design Symposium – April 9th, 2025

Watch Steve Sandler discussing how to achieve Highly Accurate Impedance Results.

Accurate measurements rely on proper calibration of the test setup to the correct reference plane. Traditional Vector Network Analyzers (VNAs) offer a variety of methods for embedding, de-embedding, and calibration to achieve high measurement accuracy. However, the Bode 100 and Bode 500 VNAs require unique approaches to obtain optimum results. In this session, we will explore calibration techniques, including embedding and de-embedding, for both traditional VNAs and the Bode 100/500. We’ll highlight common sources of measurement errors, such as challenges introduced by using probes or soldered pigtails instead of RF connectors. Additionally, we demonstrate how to establish and shift the calibration reference plane to support SPICE and EM models. While perfect measurements are unattainable, employing the appropriate calibration, embedding, and de-embedding techniques significantly enhances the accuracy of impedance measurements. This is especially critical for low-impedance, low-frequency applications, including capacitor ESL, small capacitances like inductor self-resonance, PCB traces, PDN impedance, and RF applications.

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